Structure and Surface Analysis of SHI Irradiated Thin Films of Cadmium Telluride

Pahwa, Neelam; Yadav, A.D.; Dubey, S.K.; Patel, A.P.; Singh, Arvind; Kothari, D.C.

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Title	Structure and Surface Analysis of SHI Irradiated Thin Films of Cadmium Telluride
Authors	Pahwa, Neelam Yadav, A.D. Dubey, S.K. Patel, A.P. Singh, Arvind Kothari, D.C.
ORCID
Keywords	CdTe Thermal Evaporation Swift Heavy Ion Irradiation XRD AFM PSD
Type	Article
Date of Issue	2012
URI	http://essuir.sumdu.edu.ua/handle/123456789/29600
Publisher	Сумський державний університет
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Citation	Neelam Pahwa, A.D. Yadav, S.K. Dubey, et al., J. Nano- Electron. Phys. 4 No 3, 03003 (2012)
Abstract	Cadmium Telluride (CdTe) thin films grown by thermal evaporation on quartz substrates were irradiated with swift (100 MeV) Ni + 4 ions at various fluences in the range 1011 – 1013 cm – 2. The modification in structure and surface morphology has been analyzed as a function of fluence using XRD and AFM techniques. The XRD showed a reduction in peak intensity and grain size with increasing fluence. The AFM micrographs of irradiated thin films show small spherical nanostructures. In addition to direct imaging, AFM profile data enable to derive the Power Spectral Density (PSD) of the surface roughness. In the present work PSD spectra computed from AFM data were used for studying the surface morphology of films. The PSD curves were fitted with an appropriate analytic function and characteristic parameters were deduced and discussed in order to compare film morphology with varying fluence levels. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/29600
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)