Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/31025
Or use following links to share this resource in social networks: Recommend this item
Title Preparation and Characterization of Antimony Doped Tin Oxide Thin Films Synthesized by Co-Evaporation of Sn and Sb using Plasma Assisted Thermal Evaporation
Authors Jariwala, C.
Dhivya, M.
Rane, R.
Chauhan, N.
Rayjada, P.A.
Raole, P.M.
John, P.I.
ORCID
Keywords Transparent Conducting Oxide
Antimony Doped Tin Oxide Thin Films
Co-Evaporations
Plasma Assisted Thermal Evaporation
Optical Properties
X-Ray Diffraction
Electrical Properties
Scanning Electron Microscopy
Type Article
Date of Issue 2013
URI http://essuir.sumdu.edu.ua/handle/123456789/31025
Publisher Сумський державний університет
License
Citation C. Jariwala, M. Dhivya, R. Rane, et al., J. Nano- Electron. Phys. 5 No 2, 02029 (2013)
Abstract Tin oxide (SnO2) thin films are having promising properties such as high visible transmittance and low electric resistivity, makes them very important transparent conductor in a variety of optoelectronics devices. Further, doping with pentavalent impurity such as Antimony (Sb) enhances its conductivity considerably. In order to study the effect of Antimony doping, Antimony doped tin oxide (SnO2 : Sb) thin films have been prepared by the co-evaporation of Sn and Sb using Plasma Assisted Thermal Evaporation (PATE) in oxygen (O2) partial pressure at various doping level from 4% to 25%. The influence of various Sb doping levels on the compositional, electrical, optical and structural properties have been investigated using Energy Dispersive X-ray (EDX) spectroscopy, Ultraviolet-Visible (UV-VIS) transmission spectroscopy, four-probe resistivity measurement and X-ray Diffraction (XRD), respectively. EDX studies confirmed the different Sb doping levels in the grown films from 4 % to 25 %, while electrical resistivity is obtained in range of 0.36 to 9.5 Ohmcm using four-probe setup for 4 % to 25 % Sb doping levels. Transmittance spectra measured in UV-VIS range for Sb doped films show reduction in an average transmittance in respect to increase in Sb doping levels in the grown films. Whereas, XRD analysis reveals that higher Sb doping of 25 % induce the precipitation of antimony oxide (Sb2O3) phase and its precipitation suppressed the growth of SnO2 peaks as well as responsible for reduction in conductivity and transparency. The best electrical resistivity of optimized SnO2 : Sb (5 %) is 0.36 Ohmcm without deteriorating the high (~ 80 %) average transmittance in the wavelength region 300-800 nm in comparison to undoped SnO2 film (6.57 Ohmcm) , confirm the usefulness of SnO2 : Sb (5 %) films for device applications. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/31025
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

Views

Austria Austria
1
Brazil Brazil
1
Canada Canada
2
China China
13
Denmark Denmark
1
France France
119376
Germany Germany
9
Greece Greece
1
India India
1374861356
Iran Iran
1
Ireland Ireland
27523
Italy Italy
1
Japan Japan
4
Lithuania Lithuania
1
Morocco Morocco
1
Netherlands Netherlands
729139866
Pakistan Pakistan
1
Russia Russia
119366
Saudi Arabia Saudi Arabia
1
Slovakia Slovakia
1
South Korea South Korea
138449
Sweden Sweden
1
Turkey Turkey
9460327
Ukraine Ukraine
202763
United Kingdom United Kingdom
143868
United States United States
78921557
Unknown Country Unknown Country
124572
Vietnam Vietnam
72595334

Downloads

China China
33
Germany Germany
2
India India
149173
Ireland Ireland
1
Lithuania Lithuania
1
Sweden Sweden
1
Taiwan Taiwan
1
Ukraine Ukraine
56954
United Kingdom United Kingdom
1
United States United States
-2108011284
Unknown Country Unknown Country
153
Vietnam Vietnam
1

Files

File Size Format Downloads
Jariwala C._Scanning Electron Microscopy.pdf 373,33 kB Adobe PDF -2107804963

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.