Видання зареєстровані авторами шляхом самоархівування
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Item Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis(WILEY-VCH, 2015) Доброжан, Олександр Анатолійович; Доброжан, Александр Анатольевич; Dobrozhan, Oleksandr Anatoliiovych; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Колесник, Максим Миколайович; Колесник, Максим Николаевич; Kolesnyk, Maksym Mykolaiovych; Демиденко, Максим Геннадійович; Демиденко, Максим Геннадьевич; Demydenko, Maksym Hennadiiovych; Cheong, HyeonsikNanocrystalline ZnO films were deposited on to glass substrates in the temperature range of 473–673Kusing pulsed spray pyrolysis. The structural, substructural, and optical properties of the films were investigated bymeans of X-ray diffraction analysis, Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. The effect of the substrate temperature (Ts) on the coherent scattering domain (CSD) sizes L, microstrains e, andmicrostress s grades, and the average density of dislocations r in the films were estimated through the broadening of X-ray lines using the Cauchy and Gauss approximations and the threefold function convolution method. The ZnO films grown at Ts¼623–673K possessed the highest values of L, and the lowest of e, s, and r, indicating high-crystalline quality. The Raman spectra showed peaks located at 95–98, 333–336, 415, 439–442, 572, and 578– 584 cm 1, which were interpreted as E2 low(Zn), (E2 high E2 low), E1(TO), E2 high(O), A1(LO) and E1(LO) phonon modes of the ZnO wurtzite phase. The FTIR spectra showed relatively weak signals at 856, 1405, and 1560 cm 1, corresponding to the C–H and C–O stretching modes, in addition to the main Zn–O mode at 475cm 1, indicating a low content of precursor residues.Item Magneto-optical Studying of Magnetic Nanoparticle Arrays, Obtained by Thin Metal Films Thermal Treatment(Sumy State University, 2015) Зленко, Віталій Олександрович; Зленко, Виталий Александрович; Zlenko, Vitalii Oleksandrovych; Демиденко, Максим Геннадійович; Демиденко, Максим Геннадьевич; Demydenko, Maksym Hennadiiovych; Проценко, Сергій Іванович; Проценко, Сергей Иванович; Protsenko, Serhii IvanovychMagnetic nanoparticle assemblies were obtained using thermal annealing of thin Co films (initial effective film thickness 1,5-1,8 nm), condensed by thermal evaporation on Si3N4/Si substrates. After condensation samples were annealed (T = 1020 K) in vacuum (residual gas pressure P = 10 – 7 Pa).Item Effect of Deposition Time on Structural Properties of Zinc Oxide Thin Films(Warsaw University of Technology, 2014) Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Демиденко, Максим Геннадійович; Демиденко, Максим Геннадьевич; Demydenko, Maksym HennadiiovychUsing of zinc oxide as a material of conductive and window layers of solar cells provides new possibilities for the creation of photoconverters based on Si, CdTe, CIGS and CZTSe absorbers. Due to large exciton binding energy, low toxicity and high band gap zinc oxide can be used as a material of detectors, light-emitting devices and filters of UV-radiation.Item Influence of deposition time on structure and substructure of ZnO(Riga Technical University, 2014) Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Демиденко, Максим Геннадійович; Демиденко, Максим Геннадьевич; Demydenko, Maksym Hennadiiovych; Косяк, Володимир Володимирович; Косяк, Владимир Владимирович; Kosiak, Volodymyr Volodymyrovych; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii SerhiiovychThe methods of scanning electron microscopy, X-ray diffraction and Raman spectroscopy were used for investigation of structural features of ZnO films synthesized by chemical bath deposition from zinc nitrate and ammonia solution. X-ray and Raman studies revealed that the films are single phase and highly oriented along growth texture of [002]. Condensates have a hexagonal structure with lattice constants, of a = 0.32486 nm, c = 0.52087 nm. Coherent scattering domain size and level of microstrain were, respectively, L ~ 26 - 42 nm and ε ~ (0.59 - 3.09) 10-3 and determined by regimes of films obtaining.