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    Effect of deposition temperature on the growth mechanism of chemically prepared CZTGeS thin films
    (John Wiley & Sons, Ltd., 2019) Шамардін, Антон Володимирович; Шамардин, Антон Владимирович; Shamardin, Anton Vladimirovych; Курбатов, Денис Ігорович; Курбатов, Денис Игоревич; Kurbatov, Denys Ihorovych; Medvids, Arturs
    The Cu2ZnSnGeS4 (CZTGeS) thin films were deposited by the spray pyrolysis method at different substrate temperatures without further sulfurization. The influence of various deposition temperatures on the surface morphology, microstructure, optical properties, chemical, and phase composition were investigated. The substitution mechanism of Sn/Ge in the crystal lattice of CZTGeS depending on deposition temperatures was studied. It was shown that a variation in substrate temperature has a strong effect on the surface morphology of the films. The X‐ray diffractometer (XRD), transmission electron microscope (TEM), and Raman spectroscopy (RS) analysis showed that CZTGeS films were polycrystalline with a kesterite‐type single‐phase structure and a preferential orientation of (112). The RS‐mapping analysis showed the distribution of intensities on the surfaces of the films. Optical measurements showed that CZTGeS films are highly absorbing in the visible region, and the optical band gap is shifted from 1.89 to 1.84 eV.
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    Growth Time Effect on the Structural and Sub-structural Properties of Chemically-deposited ZnO films
    (Trans Tech Publications, 2015) Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Курбатов, Денис Ігорович; Курбатов, Денис Игоревич; Kurbatov, Denys Ihorovych; Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Andreu, Cabot; Hyeonsik, Cheong
    Nanostructured ZnO films are obtained by chemical bath deposition from zinc nitrate, hexamethylenetetramine and ammonia. The evolution of the structural and sub-structural properties of the films is characterized using high resolution scanning electron microscopy (SEM) and X-ray diffraction analysis. In particular, we detail here the influence of condensation time on the crystal phase, texture quality, lattice constants, grain size, coherent scattering domain size (CSD), microstrain, stress and concentration of dislocations. Obtained condensates have the wurtzite structure with lattice parameters in the range a = 0.3248-0.3254 nm and c = 0.5206-0.5214 nm, depending on the condensation time. The grain size and microstrain in the direction perpendicular to the crystallographic planes (002) are in the range L ~ 26-42 nm and ε ~ (0.59-3.09)⋅10-3, respectively. Furthermore, the effects of deposition time on microstrain, stress and concentration of dislocations in the layers is established. By adjusting the condensation time, we are able to produce ZnO films with controlled structural properties: from nanorods to continuous nanostructured films.