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Item The Dependence of the Magnetoresistance on the Orientation of Three-layer Film Systems Based on Со / n / Со (n = Gd, Dy, Bi) in an External Magnetic Field(Sumy State University, 2013) Воробйов, Сергій Ігорович; Воробьев, Сергей Игоревич; Shutylieva, О.V.; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Chornous, Anatolii MykolaiovychThis work is devoted to general laws influence the orientation of the samples in an external magnetic field on the magnetic and magnetoresistive properties of three-layer film systems based on Со / n / Со (where n is intermediate layer of Gd, Dy and Bi). Found that the field dependence has anisotropic character, and most important magnetoresistance is observed in the perpendicular geometry measurement for all three-layer film systems. It is shown that the value of the coercive force and magnetoresistance decreases and the value of film sensitivity to the magnetic field increases in the transition from perpendicular to the transverse geometry. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35349Item Magneto-deformation effect in double-layer nanodimentional film systems(Видавництво СумДУ, 2011) Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Chornous, Anatolii Mykolaiovych; Однодворець, Лариса Валентинівна; Однодворец, Лариса Валентиновна; Odnodvorets, Larysa Valentynivna; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan Yukhymovych; Проценко, Сергій Іванович; Проценко, Сергей Иванович; Protsenko, Serhii IvanovychItem Electroconductivity and tensosensibility of multilayer films(1998) Protsenko, Ivan Yukhymovych; Odnodvorets, Larysa Valentynivna; Chornous, Anatolii Mykolaiovych; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Однодворець, Лариса Валентинівна; Однодворец, Лариса Валентиновна; Чорноус, Анатолій Миколайович; Чорноус, Анатолий НиколаевичThe experimental-research results for a size effect on the thermal coefficient of resistance (TCR) and coefficient of longitudinal-strain sensitivity (CS) of two-layer and multilayer structures based on Cr, Co, Ni, and Mo are discussed. The results obtained are in satisfactory agreement with microscopic and macroscopic theoretical models. The diagrams in the co-ordinates "TCR—thickness" and "CS—thickness" are plotted. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/1013Item The chemical transformations in metal films under influence of electron(Bulgarian academy of sciences. Institute of electronics, 1997) Protsenko, Ivan Yuhymovych; Odnodvorets, Larysa Valentynivna; Однодворець, Лариса Валентинівна; Однодворец, Лариса Валентиновна; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Chornous, Anatolii Mykolaiovych; Шовкопляс, Оксана Анатоліївна; Шовкопляс, Оксана Анатольевна; Shovkoplias, Oksana Anatoliivna; Опанасюк, Надія Миколаївна; Опанасюк, Надежда Николаевна; Opanasiuk, Nadiia MykolaivnaIt is known that changed of conditions of the films condensations (vacuum, rate of condensation, the substrate temperature), may be change of chemical composition of the thin films. Some chemical composition, which non- equilibrium in bulk samples, was to passing for polymorphic modifications (see, for example, [1]). They may be formed under influence of the size thermodynamic effects (the change of the phase equilibrium conditions). The further investigations show, what such non- equilibrium phases formed at the thermal annealing of the films samples in vacuum chamber or an electron beam directly in a microscope (the size of the one affected by an electron beam - 15 un) in result of the interaction of the metal atoms with the atoms of residual gases. The experimental results of the investigations of the chemical transition in films with bcс (Cr,V, Mo), fcc (Ni, Co) and hcp (Co, Sc, Y) lattice have been presented in the work.Item Experimental Test of a Three-Dimensional Model for Electrophysical Properties of Metal Films(The Japan Society of Applied Physics, 2000) Chornous, Anatolii Mykolaiovych; Opanasiuk, Nadiia Mykolaivna; Pohrebniak, Oleksandr Dmytrovych; Protsenko, Ivan Yukhymovych; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Опанасюк, Надія Миколаївна; Опанасюк, Надежда Николаевна; Погребняк, Олександр Дмитрович; Погребняк, Александр ДмитриевичA three-dimensional model of strain sensitivity proposed by [Tellier, Tosser: Thin Solid Films 59 (1979) 163; Tosser, Tellier and Pichard: J. Mater. Sci. 16 (1981) 944] has been tested for thin Cr, Cu and Co films. The films were obtained by electron-beam evaporation in a vacuum of 10-4 – 10-5 Pa. Film structure stabilization was carried out by heating and cooling at the rate of 3 K/min in the range of 300 to 520 K. The identity of properties of the films obtained on the glass (during the thermal coefficient of resistance (TCR) measuring) and the textolite glass (during the strain-sensitivity coefficient (SSC) measuring) substrates was examined according to Vand method on lattice distortion energy spectra for films of different thickness, where the spectra were calculated from the resistance-temperature data. It has been shown that the experimental results of the strain sensitivity agree with the calculated ones only under the assumption of size dependence of the electron mean-free path. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/846Item Сhemical and structure transition in metallic films under influence of electrons(Technical University of Lublin, 1997) Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Chornous, Anatolii Mykolaiovych; Шовкопляс, Оксана Анатоліївна; Шовкопляс, Оксана Анатольевна; Shovkoplias, Oksana Anatoliivna; Овчаренко, Юрій Михайлович; Овчаренко, Юрий Михайлович; Ovcharenko, Yurii Mykhailovych; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan YukhymovychResults of investigation of structure and chemical transition in films Sc, Y and Cr at thermal annealing in vacuum chamber and when heating the films with an electron beam directly and microscope are performed. Was received, what chemical composition of films at prolonged annealing was the same as and at annealing an electron beam. We draw a conclusion that Sc203 is formed from metastable Sc, which is not observed in massive Sc. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/840Item Some thermodynamic effects in thin film adhesion(Institute for Single Crystals, 2005) Chornous, Anatolii Mykolaiovych; Kirik, G.V.; Protsenko, Ivan Yukhymovych; Stadnik, A.D.; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Проценко, Іван Юхимович; Проценко, Иван ЕфимовичThe following thermodynamic effects have been studied in experiment: the normal adhesion of Ge films as a function of the surface energy of substrate (glass, mica, Al, Cu); the normal adhesion of Ge, Al, Cu and Cr films to Cu and (001) NaCI substrates as a function of the specific surface energy of the film; the dimensional dependence of Cu and Cr adhesion within thickness range of 20 to 250 nm; effect of finely dispersed ferromagnetic and weakly magnetic powders used as fillers in partially crystallized polymer substrates with relatively low specific surface energy on Al film adhesion. An increase in the film thickness as well as in the specific surface energy of the substrate and the film has been found to result in weakened adhesion. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/711Item Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility(Institute for Single Crystals, 1999) Lasiuchenko, Olena Borysivna; Protsenko, Ivan Yukhymovych; Chornous, Anatolii Mykolaiovych; Ласюченко, Олена Борисівна; Ласюченко, Елена Борисовна; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Чорноус, Анатолій Миколайович; Чорноус, Анатолий НиколаевичTheoretical relations have been obtained allowing to estimate the contribution of volume, surface and grain boundary scattering electrons of conductivity to the longitudinal tensosensibility coefficient of metal films. These contributions can be additively presented as у = C1Y0l + C2Ygbl + C3ydl where C1-C3 are the statistical weights of individual components. The relationships derived have been proven taking Cr, Co, Ni and Cu thin films as examples. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/709Item Conductivity and temperature coefficient of resistance of multilayered polycrystalline films(WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2006) Chornous, Anatolii Mykolaiovych; Dehtiaruk, Leonid Vasylovych; Marszalek, M.; Protsenko, Ivan Yukhymovych; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Дехтярук, Леонід Васильович; Дехтярук, Леонид Васильевич; Проценко, Іван Юхимович; Проценко, Иван ЕфимовичWe calculate the electric conductivity and the temperature coefficient of resistance (TCR) of a multilayered film consisting of the alternating polycrystalline metal layers of different thickness and purity within the relaxation time formalism. In the case of Cr, Cu and Co-based multilayered films we perform verification of our analytical formulas and demonstrate a qualitative agreement between the theoretically calculated values of the TCR and experiment. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/707Item Electrophysical properties of double-layer nickel-base and vanadium-base films within the intermediate temperature range(WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2004) Chornous, Anatolii Mykolaiovych; Protsenko, Ivan Yukhymovych; Shpetnyi, Ihor Oleksandrovych; Чорноус, Анатолій Миколайович; Чорноус, Анатолий Николаевич; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Шпетний, Ігор Олександрович; Шпетный, Игорь Александрович