Видання зареєстровані авторами шляхом самоархівування
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Item Determination of the Company's Value under the Influence of Various Factors(Qazvin Islamic Azad University, 2021) Ignatyuk, A.; Dikiy, A.; Shevtsiv, L.; Petlenko, Y.; Klymash, N.; Зайцев, Олександр Васильович; Зайцев, Александр Васильевич; Zaitsev, Oleksandr VasylovychThe authors studied and analyzed various concepts and approaches to company value management. They described the advantages and disadvantages of the leading traditional approaches to assessing the value of an enterprise and proposed a model of the dynamics of the company's value, taking into account the ownership structure, explaining the mechanism of the influence of the company's ownership structure on the capital structure. Using an example, we examined the change in the company's value by individual factors and identified which factors have the most significant positive and negative impact.Item Infuence of the thermal annealing on the morphological and structural propertie(Springer Nature, 2020) Доброжан, Олександр Анатолійович; Доброжан, Александр Анатольевич; Dobrozhan, Oleksandr Anatoliiovych; Пшеничний, Роман Миколайович; Пшеничный, Роман Николаевич; Pshenychnyi, Roman Mykolaiovych; Vorobiov, S.; Курбатов, Денис Ігорович; Курбатов, Денис Игоревич; Kurbatov, Denys Ihorovych; Komanicky, V.; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii SerhiiovychIn this work, ZnO flms were deposited onto fexible polyimide substrates by ink-jet printing nanoinks containing polyolsynthesized nanocrystals. ZnO flms were annealed at 200–400 °C for 10 min and 60 min under the ambient atmosphere. The morphological (shape, size, size distribution, surface roughness), structural (phase composition, crystal structure), optical (band gap, transmission coefcients) properties and the chemical composition of the synthesized nanocrystals and the obtained flms were studied. X-ray difraction analysis, transmission and scanning electron microscopies, atomic force microscopy, Fourier-transform infrared (FTIR) and optical spectroscopies, and energy-dispersive X-ray spectroscopy (EDS) were used to study the properties of obtained ZnO materials. The flms, annealed at Ta=400 °C for ta=60 min, and nanocrystals, synthesized for tg=120 min, have the good fundamental characteristics for application in the microelectronic devices, especially in solar cells and thermoelectric generators.