Факультет електроніки та інформаційних технологій (ЕлІТ)
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Item Strain Properties of Multicomponent Nanosize Film Materials(Hindawi, 2022) Проценко, Сергій Іванович; Protsenko, Serhii Ivanovych; Однодворець, Лариса Валентинівна; Odnodvorets, Larysa Valentynivna; Проценко, Іван Юхимович; Protsenko, Ivan Yukhymovych; Рилова, Анастасія Костянтинівна; Rylova, Anastasiia Kostiantynivna; Толстіков, Дмитро Ігорович; Tolstikov, Dmytro IhorovychThe results of the correlation between the longitudinal strain coefficient (SC) and the values of the Poisson coefficient and Grüneisen parameter for nanosize film multicomponent alloys (d≅30–50 nm, ci≅11–20 at%) are presented. It is established that in the region of elastic or quasi-elastic deformation (less than or equal to 0.4%), the value of SC is insensitive to changes in the Grüneisen parameter in the range of 1.5–2.5 units during the transition to plastic formation (more than 0.4%). The value of SC decreases from 4–5 units to 3–1 units. Similarly, SC is insensitive to changes in the Poisson coefficient less than or equal 0.4 but decreases sharply in the region of plastic deformation. It is concluded that a sensitive element based on a multicomponent nanoscale film of a solid solution, including a high-entropy one, has advantages over others due to phase stability in a wide temperature range. These materials may be used to develop the architecture of sensitive elements of sensors for various functional purposes.Item Magnetoresistive Properties of Multilayer Film Systems Based on Permalloy and Silver(Vasyl Stefanyk Precarpathian National University, 2021) Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Шуляренко, Денис Олегович; Шуляренко, Денис Олегович; Shuliarenko, Denys Olehovych; Долгов-Гордійчук, Сергій Романович; Долгов-Гордейчук, Сергей Романович; Dolhov-Hordiichuk, Serhii Romanovych; Однодворець, Лариса Валентинівна; Однодворец, Лариса Валентиновна; Odnodvorets, Larysa ValentynivnaIn this paper, the experimental investigation focuses on the magnetoresistive properties of nanosized film systems. Their structure changes from layered to granular due to transition from bilayer FM/NM (FM is a ferromagnetic material, NM is a nonmagnetic material) to [FM/NM]n multilayer film at a constant total thickness of samples. As ferromagnetic and nonmagnetic materials were chosen permalloy Ni80Fe20 (Py) and Ag, respectively. It was demonstrated that the shape of the field dependences of magnetoresistance depends on the number of bilayer Py/Ag. For as-deposited [Py/Ag]n/S at n = 8, 16, the transition from the antiferromagnetic ordering of magnetic moments to ferromagnetic one occurs under an external magnetic field. As a result, the resistivity of the samples reduced, and the giant magnetoresistive effect was realized. The increase of the number of bilayers repeats from 2 to 16 at the unchanged total thickness of the system leads to the growth of the magnetoresistance from 0.1 % to 0.35 %. During annealing up to 600 K, the magnetoresistive effect is reduced, but it does not disappear completely.Item Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver(Vasyl Stefanyk Precarpathian National University, 2020) Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Шуляренко, Денис Олегович; Шуляренко, Денис Олегович; Shuliarenko, Denys Olehovych; Пилипенко, Олександр Валерійович; Пилипенко, Александр Валериевич; Pylypenko, Oleksandr Valeriiovych; Овруцький, Максим Сергійович; Овруцкий, Максим Сергеевич; Ovrutskyi, Maksym Serhiiovych; Однодворець, Лариса Валентинівна; Однодворец, Лариса Валентиновна; Odnodvorets, Larysa ValentynivnaComplex study of electrophysical properties (the electrical resistivity r and the temperature coefficient of resistance (TCR) b) of thin-film samples based on ferromagnetic alloy Ni80Fe20 (permalloy) and noble metal Ag in a wide composition range and within the range of thickness 20-100 nm done. Thin films were obtained by the method of electron-beam co-evaporation technique at room temperature. Their composition was investigated using the method of X-ray spectrometry. The phase state was analyzed by the electron diffraction method. It was demonstrated that the crystal structure of thin films stays unchanged during the annealing process to 500 K. The size and concentration dependences of r and b values were obtained. The corresponding maximum and minimum at the concentration of Ag atoms of 50-60 at.% observed at the dependences r(cAg) and b(cAg). Size dependences r(d) and b(d) associated with the size effects in thin-film materials.