Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films
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Date
2013
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Acta physica polonica A
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Abstract
The paper deals with the investigations of structural properties of Zn1-xMnxTe lms, which were fabricated
under various deposition conditions using the thermal evaporation method in a closed volume. The surface mor-
phology of the samples was studied, the phase analysis of their structures was performed, the elemental analysis
of the lms and the crystal lattice constant were investigated. The texture perfection of the lms before and after
copper ion implantation was evaluated.
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Keywords
Ion Implantation, Zn1-xMnxTe Films, surface morphology, phase analysis, elemental analysis
Citation
Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films [Text] / A.D. Pogrebnjak, A.P. Shypylenko, H. Amekura, Y. Takeda, A.S. Opanasyuk, D.I. Kurbatov, I.A. Kolotova, O.V. Klymov, C. Kozak // Acta Physica Polonica A. –2013. – Vol. 123;№ 5. - P. 939-942.