Effect of Intrinsic Layer Thickness on PIN Structure for Tandem Solar Cell Based on Indium Gallium Nitride Using AMPS -1D

dc.contributor.authorSouilah, O.
dc.contributor.authorBenzair, A.
dc.contributor.authorDennai, B.
dc.contributor.authorKhachab, H.
dc.date.accessioned2019-01-05T10:14:19Z
dc.date.available2019-01-05T10:14:19Z
dc.date.issued2018
dc.description.abstractIn this work we have studied The effect of thickness of the intrinsic layer in the PIN structure of InGaN tandem solar cells such as photo generation rate, efficiency and recombination rate through the cells. Improvement around of 13 % of PIN tandem solar cell over PN tandem solar cell is observed for low doping concentration (NA = 1016 cm – 3; ND = 1018 cm – 3) and surface recombination (103cm/s). The photo-generated shortcircuit current density (Jsc) and the open-circuit voltage (Voc) of structures under AM 1,5G (one sun) illumination, are simulated for different thickness of intrinsic layer varying from 50 nm to 350 nm.ru_RU
dc.identifier.citationEffect of Intrinsic Layer Thickness on PIN Structure for Tandem Solar Cell Based on Indium Gallium Nitride Using AMPS -1D [Текст] / O. Souilah, A. Benzair, B. Dennai, H. Khachab // Журнал нано- та електронної фізики. - 2018. - Т.10, № 4. - 04013. - DOI: 10.21272/jnep.10(4).04013.ru_RU
dc.identifier.urihttp://essuir.sumdu.edu.ua/handle/123456789/70909
dc.language.isoenru_RU
dc.publisherSumy State Universityru_RU
dc.rights.uricneen_US
dc.subjectsolar cellru_RU
dc.subjecttandemru_RU
dc.subjectsimulationru_RU
dc.subjectPIN structureru_RU
dc.subjectAMPS-1Dru_RU
dc.subjectefficiencyru_RU
dc.subjectInGaNru_RU
dc.titleEffect of Intrinsic Layer Thickness on PIN Structure for Tandem Solar Cell Based on Indium Gallium Nitride Using AMPS -1Dru_RU
dc.typeArticleru_RU

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