Effect of change in Ba concentration on crystallintiy and dielectric constant of the sol-gel deposited barium strontium titante (BST) films on n-type Si wafer

dc.contributor.authorTripathi, C.C.
dc.contributor.authorSharma, C.
dc.contributor.authorSood, S.C.
dc.contributor.authorGupta, J.
dc.contributor.authorSingh, D.
dc.contributor.authorSingh, S.
dc.contributor.authorSharma, R.
dc.date.accessioned2012-09-03T06:45:18Z
dc.date.available2012-09-03T06:45:18Z
dc.date.issued2011
dc.description.abstractThin (Bax, Sr1 – x)TiO3 (BST) films of different chemical compositions (x 0.3 0.5 & 0.7) were prepared by the sol-gel process using barium acetate,strontium acetate and titanium isopropoxide as metal alkoxides. The titanium isopropoxide was dissolved in acetyl acetone (chelating agent) and mixing the resultant solution with barium and strontium acetate dissolved in acetic acid solution. The alkoxide group in titanium isopropoxide was replaced by acetate ligand and after hydrolysis and condensation process a complex solution was obtained. This solution was deposited on n-type (111) Si wafers by spin coating and after drying at 350 C the samples were annealed at 700 C in oxygen ambient. The precise control of composition of different species is important for producing good quality films having high crystallinity and dielectric constant. The crystallinity of the film was found to increase with the increase of Ba concentration as found from X-ray diffraction. The calculated value of dielectric constant from CV measurements revealed that the film of (Ba0.7, Sr0.3) TiO3 had the maximum dielectric constant as 463 and the surface was examined by SEM. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27856ru_RU
dc.identifier.citationEffect of change in Ba concentration on crystallintiy and dielectric constant of the sol-gel deposited barium strontium titante (BST) films on n-type Si wafer [Текст] / C.C. Tripathi, C. Sharma, S.C. Sood et al. // Journal of Nano- and Electronic Physics. — 2011. — Vol. 3, № 1, Part V : Proceedings of the International Symposium on Semiconductor Materials and Devices (ISSMD-2011), Vadodara, India, 28-30 January 2011. — P. 851-858.ru_RU
dc.identifier.urihttp://essuir.sumdu.edu.ua/handle/123456789/27856
dc.language.isoenru_RU
dc.publisherВидавництво СумДУru_RU
dc.rights.uricneen_US
dc.subject(Bax, Sr1 – x)TiO
dc.subjectXRD
dc.subjectдиэлектрическая проницаемость
dc.subjectdielectric constant
dc.subjectдіелектрична проникність
dc.subjectsol-gel porcess
dc.subjectCV-измерения
dc.subjectCV-вимірювання
dc.subjectCV-measurement
dc.titleEffect of change in Ba concentration on crystallintiy and dielectric constant of the sol-gel deposited barium strontium titante (BST) films on n-type Si waferru_RU
dc.typeArticleru_RU

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Tripathi.pdf
Size:
1.15 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
4.35 KB
Format:
Item-specific license agreed upon to submission
Description: