Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review)

Panchal, С. J.; Panchal, С. J.; Panchal, С. J.; Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Desai, M. S.; Desai, M. S.; Desai, M. S.; Protsenko, Ivan Yukhymovych

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Title	Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review)
Authors	Panchal, С. J. Panchal, С. J. Panchal, С. J. Opanasiuk, Anatolii Serhiiovych Kosiak, Volodymyr Volodymyrovych Desai, M. S. Desai, M. S. Desai, M. S. Protsenko, Ivan Yukhymovych
ORCID	http://orcid.org/0000-0002-1888-3935 http://orcid.org/0000-0003-3351-9303
Keywords	physical properties defects zinc and cadmium chalcogenides films crystal structure
Type	Article
Date of Issue	2011
URI	http://essuir.sumdu.edu.ua/handle/123456789/30129
Publisher	Видавництво СумДУ
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Citation	Panchal C. J. Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review) [Текст] / C.J. Panchal, A.S. Opanasyuk, V.V. Kosyak, M.S. Desai, I.Yu. Protsenko // J. Nano- Electron. Phys. – 2011. – V. 3 (1). – P. 274-301.
Abstract	In this paper, the structural properties of the zinc and cadmium chalcogenide thin films are considered. The influence of the structural defects such as grain boundaries, dislocations, native point defects, etc., on the optical and electrical properties of the thin films was studied. The methods of the II-VI thin films deposition are described. The influence on the sub-structural properties (phase compositions, texture, grain size, tacking faults concentration, micro deformation levels, and coherent domain size) of the thin films grown by the close-spaced vacuum evaporation method was analyzed. The growth conditions of the thin films with optimized parameters have been determined. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30129
Appears in Collections:	Наукові видання (ЕлІТ)