Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/37132
Title: X-Ray Diffraction Characterization of Nanoscale Strains and Defects in Yttrium Iron Garnet Films Implanted with Fluorine Ions
Authors: Olikhovskii, S.I.
Skakunova, O.S.
Molodkin, V.B.
Lizunov, V.V.
Kyslovs’kyy, Ye.M.
Vladimirova, T.P.
Reshetnyk, O.V.
Pylypiv, V.M.
Kotsyubynsky, V.O.
Ostafiychuk, B.K.
Yaremiy, I.P.
Garpul’, O.Z.
Keywords: X-Ray diffraction theory
Yttrium iron garnet
Film
Ion implantation
Strain
Defects
Issue Year: 2014
Publisher: Sumy State University
Citation: Proc. NAP 3, 01PCSI10 (2014)
Abstract: The theoretical diffraction model for a crystalline multilayer system with inhomogeneous strain profile and randomly distributed defects has been created by using the statistical dynamical theory of X-ray diffraction in imperfect crystals. The dynamical scattering peculiarities in both coherent and diffuse scattering intensities have been taken into account for all the layers of the system by using derived recurrence relations between coherent scattering amplitudes. The investigated yttrium-iron garnet films grown on gadolinium-gallium garnet substrate were implanted with different doses of 90 keV F+ ions. The rocking curves measured from the as-grown and implanted samples have been treated by using the proposed theoretical model. This model has allowed for the reliable self-consistent determination of strain profile parameters and structural defect characteristics in both implanted film and substrate of the investigated samples.
URI: http://essuir.sumdu.edu.ua/handle/123456789/37132
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

Views
Other87
Canada1
Germany6
France1
United Kingdom1
Hong Kong1
Italy2
Japan1
Singapore2
Taiwan1
Ukraine10
United States3
Downloads
Other16
China18
Germany2
France2
Israel1
Japan1
Moldova1
Russia3
Slovakia1
Ukraine7
United States2


Files in This Item:
File Description SizeFormatDownloads 
Olikhovskii.pdf1.21 MBAdobe PDF54Download


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.