Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/37144
Title: Thickness Dependent Structural, Magnetic and Transport Properties of of Cu / Co Thin Film and Multilayer Structures
Authors: Brajpuriya, R.
Vyas, A.
Keywords: Co and Cu film
Magnetization
XRD
interface
Issue Year: 2014
Publisher: Sumy State University
Citation: Proc. NAP 3, 02MAN03 (2014)
Abstract: Structural, magnetic and transport properties of electron beam evaporated Co/Cu thin film and multilayer structures (MLS) having different layer thicknesses have been characterized using XRD, MOKE and resistivity techniques. The structural studies show different crystal structures for different sub-layer thicknesses. The Co (300 Ǻ) single layer film is amorphous, while Cu (300 Ǻ) film is microcrystalline in nature. The particle size is found to decrease as the number of interfaces increase. The corresponding magnetic and resistivity measurements show an increase in saturation field and resistivity. However, coercivity decreases with decrease in particle size. The results conclude that these properties are greatly influenced by various micro structural parameters such as layer thickness, number of bilayers and the quality of interfaces formed under different growth conditions.
URI: http://essuir.sumdu.edu.ua/handle/123456789/37144
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

Views
Other95
Canada1
China1
Germany3
France1
United Kingdom1
India6
Italy1
Russia3
Sweden1
Ukraine1
United States1
Downloads
Other26
China8
Germany2
India4
Sweden1
United States2


Files in This Item:
File Description SizeFormatDownloads 
brajpuriya_magnetization.pdf375.09 kBAdobe PDF43Download


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.