Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/37236
Title: Preparation, Structural and Optical Characterization of ZnO/Ag Thin Film by CVD
Authors: Jamil, N.Y.
Najim, S.A.
Muhammed, A.M.
Rogoz, V.M.
Keywords: CVD
X-ray Diffraction
SEM
Issue Year: 2014
Publisher: Sumy State University
Citation: Proc. NAP 3, 02NEA09 (2014)
Abstract: Zinc Oxide thin films doped with Ag have been synthesized by CVD technique. By increasing the dopant from 0 to 10 % Ag in ZnO thin films were found to lead to pronounced changes in their morphology. From optical properties the band gap energy of pure ZnO thin film was 3.25 eV, with the increasing of Ag doping from 1 to 10% it is not affected. X-ray diffraction has shown that the maximum intensity peak corresponds to the (101) predominant orientation for ZnO and ZnO:Ag. SEM images show that more crystalline behavior by increasing the doping. EDXA analysis showed that the structure of ZnO film contains Zn and O elements and Ag, Cu, Si for doping at 10 % Ag.
URI: http://essuir.sumdu.edu.ua/handle/123456789/37236
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

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