Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/42581
Title: Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance
Authors: Vozny, A.A.
Stetsenko, Μ.Ο.
Rudenko, S.P.
Kosiak, Volodymyr Volodymyrovych
Maksimenko, L.S.
Opanasiuk, Anatolii Serhiiovych 
Serdega, B.K.
Keywords: Thin films
SnxSy
Co-evaporation
Surface morphology
X-ray diffraction
Surface plasmon
Modulation-polarization spectroscopy
Issue Year: 2015
Publisher: Sumy State University
Citation: Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06.
Abstract: The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.
URI: http://essuir.sumdu.edu.ua/handle/123456789/42581
Type: Theses
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