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Title Structural features of ZnOxS1- nanostructured films
Other Titles Структурные особенности наноструктурированных пленок ZnOxS1-x
Authors Berestok, Taisiia Oleksandrivna
Opanasiuk, Nadiia Mykolaivna
Opanasiuk, Anatolii Serhiiovych  
ORCID http://orcid.org/0000-0002-1888-3935
Keywords структурні особливості
структурные особенности
structural features
наноструктури
наноструктуры
nanostructure
ZnOxS1-x
Type Conference Papers
Date of Issue 2014
URI http://essuir.sumdu.edu.ua/handle/123456789/46114
Publisher IEEE Publishing
License
Citation Berestok, T.O. Structural features of ZnOxS1- nanostructured films [Text] / T.O. Berestok, A.S. Opanasyuk, N.M. Opanasyuk // 23nd International Crimean Conference «Microwave & Telecommunication Technology», (СriMiCo-2014), Sevastopol', 7-13 September. - Sevastopol, 2014. - P. 777-778.
Abstract В работе методом химического осаждения из растворов ацетата цинка, тиамочевины и аммиака получены наноструктурированные слои твердых растворов ZnOxS1-x. Структурные особенности пленок ZnOxS1-x исследованы методами растровой микроскопии и рентгеновской дифрактометрии. В результате установлено влияние времени осаждения на элементный и фазовый состав тонких слоев, а также их структурные характеристики, такие как период решетки и качество текстуры.
In this paper, ZnOxS1-x nanostructured flayers were obtained by chemical bath deposition from solutions of zinc acetate, ammonia and thiourea. Structural features of ZnOxS1-x films were studied by scanning electron microscopy and X-ray diffraction. It is found the effect of condensation time on the elemental and phase composition of the thin layers, as well as their structural characteristics, such as lattice constants and growth texture.
Appears in Collections: Наукові видання (ЕлІТ)

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