Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility

Lasiuchenko, Olena Borysivna; Protsenko, Ivan Yukhymovych; Chornous, Anatolii Mykolaiovych

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/709

Or use following links to share this resource in social networks: Recommend this item

Title	Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility
Authors	Chornous, Anatolii Mykolaiovych Lasiuchenko, Olena Borysivna Protsenko, Ivan Yukhymovych
ORCID	http://orcid.org/0000-0002-5009-5445 http://orcid.org/0000-0003-3351-9303
Keywords	grain-boundary scattering surface scattering size effect of tensosensibility зернограничне розсіювання поверхневе розсіювання розмірний ефект тензочутливості зернограничное рассеивание поверхностное рассеивание размерный эффект тензочувствительности
Type	Article
Date of Issue	1999
URI	http://essuir.sumdu.edu.ua/handle/123456789/709
Publisher	Institute for Single Crystals
License
Citation	Lasyuchenko, O.B. Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility [Text] / O.B. Lasyuchenko, I.Yu. Protsenko, A.M. Chornous // Functional Materials 6, №. 5, 880-883 (1999).
Abstract	Theoretical relations have been obtained allowing to estimate the contribution of volume, surface and grain boundary scattering electrons of conductivity to the longitudinal tensosensibility coefficient of metal films. These contributions can be additively presented as у = C1Y0l + C2Ygbl + C3ydl where C1-C3 are the statistical weights of individual components. The relationships derived have been proven taking Cr, Co, Ni and Cu thin films as examples. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/709
Appears in Collections:	Наукові видання (ЕлІТ)