Showing results 1 to 2 of 2
| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2013 | Electrical Characterization of TiO2 Insulator Based Pd / TiO2 / Si MIS Structure Deposited by Sol-Gel Process | Shubham, Kumar; Khan, R.U. | Article | -1742638060 | 815192322 |
| 2020 | Realization of the Kelvin Probe System for the Surface Treatment of a Semiconductor | Zegadi, C.; Lounis, Z.; Haichour, A.; Kaddour, A. Hadj; Ghaffor, D. | Article | 1867071 | 1637938 |