Showing results 1 to 1 of 1
| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2020 | Angular Ellipsometry of Porous Silicon Surface Layers | Poperenko, L.V.; Rozouvan, S.G.; Yurgelevych, I.V.; Lishchuk, P.O. | Article | 1819987909 | 992118207 |