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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2022 | Improvement Analysis of Leakage Currents with Stacked High-k/Metal Gate in 10 nm Strained Channel HOI FinFET | Payal, K.; Swagat, N.; Priyanka, S.; Rudra, S.D. | Article | 739747564 | 1036991325 |