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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2013 | Influence of Impact Ionization Process on Current-Voltage Characteristics of Nanoscale Silicon n-Channel MOSFET | Borzdov, A.V.; Borzdov, V.M.; Pozdnyakov, D.V.; Komarov, F.F. | Conference Papers | 62979759 | 160019295 |