Факультет електроніки та інформаційних технологій (ЕлІТ)
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Item The surface morphology, structural properties and chemical composition of Cd1-xZnxTe polycrystalline thick films deposited by close spaced vacuum sublimation(Elsevier, 2017) Знаменщиков, Ярослав Володимирович; Знаменщиков, Ярослав Владимирович; Znamenshchykov, Yaroslav Volodymyrovych; Косяк, Володимир Володимирович; Косяк, Владимир Владимирович; Kosiak, Volodymyr Volodymyrovych; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Ponomarov, А.А.; Romanenko, A.V.; Stanislavov, A.S.; Medvids, A.; Шпетний, Ігор Олександрович; Шпетный, Игорь Александрович; Shpetnyi, Ihor Oleksandrovych; Gorobets, Yu.I.; Dauksta, E.Тонкі полікристалічні плівки Cd1-xZnxTe з х варіювалися від 0,37 до 0,80 були отримані метод вакуумної сублімація з близькою відстанню. Для дослідження властивостей структурних властивостей були проведені дослідження PIXE і Раман. Визначення хімічного складу плівок за допомогою EDS, PIXE і XRD показало гарне співвідношення результатів. Раман-спектроскопія виявляє зв'язок між концентрацією цинку і коливальними властивостями плівок. Дослідження просторового розподілу хімічних елементів на поверхні плівки за допомогою мікропіксела і мікрорамановской спектроскопії показали, що плівки однорідні і не містять вторинних фаз, таких як CdTe, ZnTe і ТеItem Composition dependence of structural and optical properties of Cd1-xZnxTe thick films obtained by the close-spaced sublimation(Elsevier, 2016) Косяк, Володимир Володимирович; Косяк, Владимир Владимирович; Kosyak, Volodymyr Volodymyrovych; Знаменщиков, Ярослав Володимирович; Знаменщиков, Ярослав Владимирович; Znamenshchykov, Yaroslav Volodymyrovych; Čerškus, A.; Dauksta, E.; Гнатенко, Юрій Павлович; Гнатенко, Юрий Павлович; Gnatenko, Yurii Pavlovych; Grase, L.; Vecstaudza, J.; Medvids, A.; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii SerhiiovychУ даній роботі представлені результати структурної, фотолюмінесценції та рамановської характеристики товстих плівок Cd1-xZnxTe з різною концентрацією цинку, отриманих методом вакуумної сублімаціїз близькою відстанню. Аналіз зразків рентгенівських променів дозволяє визначити вплив концентрації цинку на якість кристалів плівок. Було встановлено, що зразки з х ≈ 0,10 і х ≈ 0,32 мають високу якість кристалів. Однак зі збільшенням концентрації цинку якість кристала зменшується. Цей результат був підтверджений дослідженням фотолюмінесценції. А саме, спостерігалося значне погіршення оптичних властивостей зразків з високою концентрацією цинку (х> 0,32). Спектроскопія комбінаційного розсіювання показує співвідношення між концентрацією цинку і коливальними властивостями плівок. Крім того,метод мікрораманів показує, що отримані плівки є однорідними і вільними від включень телуру.Item Study of the structural and photoluminescence properties of CdTe polycrystalline films deposited by closed space vacuum sublimation(Elsevier, 2010) Косяк, Володимир Володимирович; Косяк, Владимир Владимирович; Kosiak, Volodymyr Volodymyrovych; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Bukivskyi, P.M.; Hnatenko, Y.P.The polycrystalline CdTe films were deposited by the close-spaced vacuum evaporation at the different substrate temperatures (150–550 °C). The X-ray diffraction measurements of structural and substructural properties of these films were carried out to study their phase composition and texture. The films’ parameters such as the coherent scattering domain size, microdeformation level and mean density of dislocations were determined based on the broadening of diffraction peaks. In this case the Hall and three-fold convolution approximations were used. Surface morphology, grain size and growth mechanism of the films were determined by the scanning electron microscopy. The low temperature photoluminescence measurements allowed us to establish the correlation between the point and extended defect structure on the one hand and the growth conditions on the other. As a result, the growth conditions of CdTe polycrystalline films with fairly good crystal and optical quality were determined.Item Growth Time Effect on the Structural and Sub-structural Properties of Chemically-deposited ZnO films(Trans Tech Publications, 2015) Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Курбатов, Денис Ігорович; Курбатов, Денис Игоревич; Kurbatov, Denys Ihorovych; Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Andreu, Cabot; Hyeonsik, CheongNanostructured ZnO films are obtained by chemical bath deposition from zinc nitrate, hexamethylenetetramine and ammonia. The evolution of the structural and sub-structural properties of the films is characterized using high resolution scanning electron microscopy (SEM) and X-ray diffraction analysis. In particular, we detail here the influence of condensation time on the crystal phase, texture quality, lattice constants, grain size, coherent scattering domain size (CSD), microstrain, stress and concentration of dislocations. Obtained condensates have the wurtzite structure with lattice parameters in the range a = 0.3248-0.3254 nm and c = 0.5206-0.5214 nm, depending on the condensation time. The grain size and microstrain in the direction perpendicular to the crystallographic planes (002) are in the range L ~ 26-42 nm and ε ~ (0.59-3.09)⋅10-3, respectively. Furthermore, the effects of deposition time on microstrain, stress and concentration of dislocations in the layers is established. By adjusting the condensation time, we are able to produce ZnO films with controlled structural properties: from nanorods to continuous nanostructured films.Item Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance(Sumy State University, 2015) Vozny, A.A.; Stetsenko, Μ.Ο.; Rudenko, S.P.; Косяк, Володимир Володимирович; Косяк, Владимир Владимирович; Kosiak, Volodymyr Volodymyrovych; Maksimenko, L.S.; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Serdega, B.K.The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.Item Structural Properties of Chemically-Deposited ZnOхS1-x Solid Solutions(Sumy State University, 2014) Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Опанасюк, Надія Миколаївна; Опанасюк, Надежда Николаевна; Opanasiuk, Nadiia Mykolaivna; Gnatenko, Yu.P.In paper, by the methods of scanning electron microscopy and X-ray diffraction there are investigated the structural features of films of ZnOxS1-x solid solutions, which are deposited from solutions of zinc acetate, thiourea and ammonia. As a result, the influence of deposition time on the elemental and phase composition of thin films and their structural characteristics are studied. It is established that increasing time of deposition of the films leads to an increase of sulfur concentration in their composition from 9.86 at. % to 14.06 at. %. It is shown that all condensates have hexagonal structure with lattice constants of a = 0.32486 nm, c = 0.52086, c/a = 1.603, and growth texture of [200], the quality of which depends on the deposition time.Item Structural Properties of the SnxSy Films Obtained by the Thermal Vacuum Co-evaporation(Sumy State University, 2014) Voznyi, A.A.; Kosyak, V.V.; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Kuznetsov, V.М.The present work deals with the study of the structural properties of the SnxSy thin films deposited by the closed-spaced vacuum co-evaporation (CSVCE) method. Calculation of temperature dependencies of the sulfur and tin vapor pressures allows to estimate growth conditions of the films with the stoichiometric composition. The effect of growth conditions on surface morphology and structural properties of SnxSy films were studied. Surface morphology of obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the X-ray diffraction (XRD) method. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDAX) spectroscopy. Influence of the substrate temperature on chemical composition of thin films and their structural characteristics was also investigated.Item Structural Properties of Chemically-Deposited ZnOхS1-x Solid Solutions(Sumy State University, 2014) Бересток, Таїсія Олександрівна; Бересток, Таисия Александровна; Berestok, Taisiia Oleksandrivna; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Опанасюк, Надія Миколаївна; Опанасюк, Надежда Николаевна; Opanasiuk, Nadiia Mykolaivna; Гнатенко, Юрій Павлович; Гнатенко, Юрий Павлович; Hnatenko, Yurii PavlovychIn paper, by the methods of scanning electron microscopy and X-ray diffraction there were investigated the structural features of films of ZnOxS1-x solid solutions, which were deposited from solutions of zinc acetate, thiourea and ammonia. As a result, the influence of deposition time on the elemental and phase composition of thin films and their structural characteristics were studied. It is established that increasing time of deposition of the films leads to an increase of sulfur concentration in their composition from 9.86 at. % to 14.06 at. %. It is shown that all condensates have hexagonal structure with lattice constants of a = 0.32486 nm, c = 0.52086, c/a = 1.603, and growth texture of [200], the quality of which depends on the deposition time. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37088Item Study of the correlation between structural and photoluminescence properties of CdSe thin films deposited by close-spaced vacuum sublimation(Elsevier Ltd, 2014) Гнатенко, Юрій Павлович; Гнатенко, Юрий Павлович; Hnatenko, Yurii Pavlovych; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Іващенко, Максим Миколайович; Иващенко, Максим Николаевич; Ivashchenko, Maksym Mykolaiovych; Буківський, Петро Миколайович; Букивский, Петр Николаевич; Bukivskyi, Petro Mykolaiovych; Фарина, Іван Олександрович; Фарина, Иван Александрович; Faryna, Ivan OleksandrovychCdSe polycrystalline films were deposited by a close-spaced vacuum sublimation method at different substrate temperatures(Ts) using glass slides as substrates. At Ts<673K the films have a structure with strong dispersion of grain size(d) (from0.1to0.3 μm). In this case the layer-by-layer mechanism determines the growth process of the layers. For Ts=873K they have a columnar-like structure with a clear growth texture and the average grain size d=3–4 μm. The films obtained at Ts>473K are n-type and only correspond to a single wurtzite phase. The crystallites are preferentially oriented with the(102) planes parallel to the substrate. At lower temperatures the films are bi-phase. The microstress level in CdSe films obtained at Тs=873 K (0.5 10 3) is considerably smaller than for the films deposited at Тs=773K (4 10 3). Increase of the value of Ts improves the stoichiometry of CdSe films. Analysis of the low-temperature photoluminescence(PL) spectra let us determine the nature and energy of point and extended defects in the investigated films. It was shown that the films contain Na(Li) and P residual impurities. The results of the structural and PL measurements showed that the CdSe polycrystalline films are of fairly good crystal and optical quality for Ts=873K and can be suitable for various applications. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37075Item Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy(ELSEVIER, 2014) Нам, Д.; Nam, Dahyun; Опанасюк, Анатолій Сергійович; Опанасюк, Анатолий Сергеевич; Opanasiuk, Anatolii Serhiiovych; Коваль, Павло Вікторович; Коваль, Павел Викторович; Koval, Pavlo Victorovich; Пономарьов, Олександр Георгійович; Пономарев, Александр Георгиевич; Ponomarov, Oleksandr Heorhiiovych; Джонг, А.Р.; Jeong, Ah Reum; Кім, Д.Й.; Ким, Д.Й.; Kim, Gee Yeong; Джо, В.; Jo, William; Чеонг, Г.; Cheong, HyeonsikCompositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37033