Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance
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Date
2015
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Sumy State University
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Abstract
The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by
the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.
Keywords
Thin films, SnxSy, Co-evaporation, Surface morphology, X-ray diffraction, Surface plasmon, Modulation-polarization spectroscopy
Citation
Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06.