Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance
| dc.contributor.author | Vozny, A.A. | |
| dc.contributor.author | Stetsenko, Μ.Ο. | |
| dc.contributor.author | Rudenko, S.P. | |
| dc.contributor.author | Косяк, Володимир Володимирович | |
| dc.contributor.author | Косяк, Владимир Владимирович | |
| dc.contributor.author | Kosiak, Volodymyr Volodymyrovych | |
| dc.contributor.author | Maksimenko, L.S. | |
| dc.contributor.author | Опанасюк, Анатолій Сергійович | |
| dc.contributor.author | Опанасюк, Анатолий Сергеевич | |
| dc.contributor.author | Opanasiuk, Anatolii Serhiiovych | |
| dc.contributor.author | Serdega, B.K. | |
| dc.date.accessioned | 2015-11-04T12:56:14Z | |
| dc.date.available | 2015-11-04T12:56:14Z | |
| dc.date.issued | 2015 | |
| dc.description.abstract | The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance. | ru_RU |
| dc.identifier.citation | Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06. | ru_RU |
| dc.identifier.sici | 0000-0002-1888-3935 | en |
| dc.identifier.uri | http://essuir.sumdu.edu.ua/handle/123456789/42581 | |
| dc.language.iso | en | ru_RU |
| dc.publisher | Sumy State University | ru_RU |
| dc.rights.uri | cne | en_US |
| dc.subject | Thin films | ru_RU |
| dc.subject | SnxSy | ru_RU |
| dc.subject | Co-evaporation | ru_RU |
| dc.subject | Surface morphology | ru_RU |
| dc.subject | X-ray diffraction | ru_RU |
| dc.subject | Surface plasmon | ru_RU |
| dc.subject | Modulation-polarization spectroscopy | ru_RU |
| dc.title | Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance | ru_RU |
| dc.type | Theses | ru_RU |