Факультет електроніки та інформаційних технологій (ЕлІТ)
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Item Electrophysical Properties of Granular Film Alloys Based on Fe and Ag or Au(Sumy State University, 2015) Шабельник, Юрій Михайлович; Шабельник, Юрий Михайлович; Shabelnyk, Yurii Mykhailovych; Чешко, Ірина Володимирівна; Чешко, Ирина Владимировна; Cheshko, Iryna Volodymyrivna; Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan YukhymovychThe experimental results of electrophysical properties of granular film alloys based on Fe and Ag or Au are presented. It is established that the value of the temperature coefficient of resistance depends on the total thickness of the samples and the concentration of magnetic component. The components concentration in the system is shown to affect the formation of the solid solution and the granular film alloy. The optimal concentration value of Fe, in which the thermally stable solid solution forms, is 45 at. %.Item Effect of Substrate Temperature on the Electrochromic Properties of Nickel Oxide Thin Films by e-Beam Evaporation Method(Sumy State University, 2013) Patel, K.J.; Desai, M.S.; Panchal, C.J.; Mehta, P.K.; Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan YukhymovychNickel Oxide (NiO), an anodic coloring material, is used as a counter electrode layer in Electrochromic (EC) devices in combination with Tungsten Oxide (WO3) as an EC layer. The NiO thin films were prepared on glass and indium tin oxide coated glass substrates by e-beam evaporation technique at different substrate temperatures ranging from room temperature (27 C) to 400 C. The crystallization of the film improves with increase in substrate temperature as inferred from the glancing incident X-ray diffraction measurement. The increase in substrate temperature of the films causes an increase in the transmittance. The electrochromic properties of NiO thin films were investigated in an aqueous alkaline electrolyte (1M KOH) by means of transmittance, cyclic voltammetry (CV), and chronoamperometry (CA) measurements. It is found that films prepared at lower substrate temperature, up to 100 C, have better EC properties. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35328Item Electrophysical Properties of Nanodimentional Pt Thin Films(Sumy State University, 2012) Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Тищенко, Костянтин Володимирович; Тищенко, Константин Владимирович; Tyshchenko, Kostiantyn Volodymyrovych; Шумакова, Наталія Іванівна; Шумакова, Наталия Ивановна; Shumakova, Nataliia Ivanivna; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan Yukhymovych; Shirzadfar, H.The results of research structural and phase state, electrophysical properties (resistivity, temperature coefficient of resistance (TCR), strain gauge) of Pt thin films in the range of thicknesses from 7 to 50 nm were presented. Thin films Pt have fcc structure with lattice parameter a 0,390 nm after annealing. The temperature dependences characterized by relative large value of resistivity (ρ ~ 10-6 Ohm m) and relative small value of TCR (β ~ 10-4 K-1) respectively. Strain properties characterized by a wide interval of elastic deformation (more than 1 %), relatively low value of gauge factor (1,5 – 3 units). When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35013Item Strain Properties of Nanodimentional Thin Film Systems Based on Ag and Co(Sumy State University, 2012) Макуха, Зінаїда Миколаївна; Макуха, Зинаида Николаевна; Makukha, Zinaida Mykolaivna; Шабельник, Юрій Михайлович; Шабельник, Юрий Михайлович; Shabelnyk, Yurii Mykhailovych; Пазуха, Ірина Михайлівна; Пазуха, Ирина Михайловна; Pazukha, Iryna Mykhailivna; Проценко, Іван Юхимович; Проценко, Иван Ефимович; Protsenko, Ivan Yukhymovych; Panchal, C.J.The results of research strain deformation properties of thin films Ag, Co and two-layer film systems Ag/Co in the range of deformation l 0 – 1% were presented. The plastic deformation in Co layer caused a similar deformation in the entire film system, even if the strain range of Ag layer is not reached the limits of the transition elastic/plastic deformation. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/34874