Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/26553
Or use following links to share this resource in social networks: Recommend this item
Title Влияние параметров ВЧ – разряда на сверхтвердость, стехиометрию наноструктурных покрытий Zr-Ti-Si-N
Authors Ткаченко, Роман Юрійович
Ткаченко, Роман Юрьевич
Tkachenko, Roman Yuriiovych
ORCID
Keywords ВЧ-разряд
ВЧ-розряд
RF discharge
стехиометрия
стехіометрія
stoichiometry
Type Competitive_scientific_work
Date of Issue 2012
URI http://essuir.sumdu.edu.ua/handle/123456789/26553
Publisher
License
Citation
Abstract
Appears in Collections: Наукові роботи студентів, магістрів, аспірантів (ЕлІТ)

Views

Belarus Belarus
1
Canada Canada
2
China China
76825223
Côte d’Ivoire Côte d’Ivoire
1417904
France France
4
Germany Germany
5671617
Greece Greece
1
Iran Iran
1
Ireland Ireland
2835809
Italy Italy
5
Lithuania Lithuania
1
Netherlands Netherlands
6781
Poland Poland
12
Russia Russia
34
Singapore Singapore
1448119339
Sweden Sweden
1
Switzerland Switzerland
1
Taiwan Taiwan
1
Turkey Turkey
7
Ukraine Ukraine
76825225
United Kingdom United Kingdom
-1398728619
United States United States
-1398728618
Unknown Country Unknown Country
96
Uzbekistan Uzbekistan
3

Downloads

Australia Australia
1
Belarus Belarus
15644524
Bulgaria Bulgaria
1
China China
2
Côte d’Ivoire Côte d’Ivoire
1
Estonia Estonia
1
France France
5
Georgia Georgia
1
Germany Germany
27082
India India
1
Israel Israel
1
Italy Italy
3
Japan Japan
1
Kazakhstan Kazakhstan
5
Lithuania Lithuania
1
Netherlands Netherlands
76825222
Poland Poland
6
Romania Romania
1
Russia Russia
42
Ukraine Ukraine
230448585
United Kingdom United Kingdom
51221330
United States United States
-1398728619
Unknown Country Unknown Country
348
Uzbekistan Uzbekistan
76825227

Files

File Size Format Downloads
Tkachenko_Radioelektronika.pdf 788,74 kB Adobe PDF -947736228

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.