Thin overlayer influence on electrophysical properties of nickel films
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2006
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WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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Abstract
In this work it is experimentally investigated a size effect in temperature coefficient of resistance (TCR) of Ni films with Cu and Si02 thin overiayer. The parameters of electrical transfer (the mean-free path of electron, the reflectivity coefficient of the external surfaces, the reflection and transmission coefficients at the grain boundary) were calculations. Decreasing of the value of the reflectivity coefficient is due to the change of the surface microrelief. It is show that the value of TCR decreases caused by the conditions of scattering changes on internal and external boundaries.
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Keywords
thin films, resistivity, reflection coefficient, тонкі плівки, питомий опір, коефіцієнт відбиття, тонкие пленки, удельное сопротивление, коэффициент отражения
Citation
Hovorun T. Thin overlayer influence on electrophysical properties of nickel films [Text] / T. Hovorun, A. Chornous // Cryst. Res. Technol. 41, No 5, 458 - 463 (2006).