Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation

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2016

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Journal of Alloys and Compounds
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Abstract

This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1−xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions.

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Кристалічна структура, Кристаллическая структура, Crystal structure, Потрійні напівпровідникові сполуки, Тройные полупроводниковые структуры, Semiconducting ternary compounds, Дефекти кристалічної гратки, Дефекты кристаллической решетки, Lattice defects

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Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation [Text] / V.V. Kosiak, Ya.V. Znamenshchykov, А. Čerškus [et al.] // Journal of Alloys and Compounds. - 2016. - No. 682. - P. 543–551.

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