Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation

dc.contributor.authorКосяк, Володимир Володимирович
dc.contributor.authorКосяк, Владимир Владимирович
dc.contributor.authorKosiak, Volodymyr Volodymyrovych
dc.contributor.authorЗнаменщиков, Ярослав Володимирович
dc.contributor.authorЗнаменщиков, Ярослав Владимирович
dc.contributor.authorZnamenshchykov, Yaroslav Volodymyrovych
dc.contributor.authorČerškus, А.
dc.contributor.authorGnatenko, Yu.P.
dc.contributor.authorGrase, L.
dc.contributor.authorVecstaudza, J.
dc.contributor.authorMedvids, A.
dc.contributor.authorОпанасюк, Анатолій Сергійович
dc.contributor.authorОпанасюк, Анатолий Сергеевич
dc.contributor.authorOpanasiuk, Anatolii Serhiiovych
dc.contributor.authorMezinskis, G.
dc.date.accessioned2016-09-15T12:38:56Z
dc.date.available2016-09-15T12:38:56Z
dc.date.issued2016
dc.descriptionNew approach for deposition of Cd1−xZnxTe thick films has been developed. Effect of chemical composition on Cd1−xZnxTe thick films properties was studied. The proposed approach allows obtaining of high-quality Cd1−xZnxTe thick films. Compositional dependence of Raman modes frequencies was established.ru_RU
dc.description.abstractThis paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1−xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions.ru_RU
dc.description.sponsorshipThis work was supported by Erasmus Ianus Programme and by the Ministry of Education, Science of Ukraine (Grant No. 0115U003242, 0113U000131) by theNational Academy of Sciences of Ukraine (Grants Nos. BС-157-15 and B-146-15) and State Fund for Fundamental Research (project N GP/F61/087).ru_RU
dc.identifier.citationComposition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation [Text] / V.V. Kosiak, Ya.V. Znamenshchykov, А. Čerškus [et al.] // Journal of Alloys and Compounds. - 2016. - No. 682. - P. 543–551.ru_RU
dc.identifier.sici0000-0002-6866-0414en
dc.identifier.urihttp://essuir.sumdu.edu.ua/handle/123456789/46175
dc.language.isoenru_RU
dc.publisherJournal of Alloys and Compoundsru_RU
dc.rights.uricneen_US
dc.subjectКристалічна структураru_RU
dc.subjectКристаллическая структураru_RU
dc.subjectCrystal structureru_RU
dc.subjectПотрійні напівпровідникові сполукиru_RU
dc.subjectТройные полупроводниковые структурыru_RU
dc.subjectSemiconducting ternary compoundsru_RU
dc.subjectДефекти кристалічної граткиru_RU
dc.subjectДефекты кристаллической решеткиru_RU
dc.subjectLattice defectsru_RU
dc.titleComposition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimationru_RU
dc.typeArticleru_RU

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