Atomic Force Analysis of Elastic Deformations of CD
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Date
2013
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Сумський державний університет
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Abstract
The procedure for the determination of elastic parameters according to reference nanometer lithographic marks by atomic force microscopy on samples with up to microscopic sizes is proposed. Analysis of dynamic changes of elastic characteristics that makes it possible to establish the critical rotation velocity of a CD without plastic deformations has been made.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33672
Keywords
Elastic effects, Atomic force microscopy, Nanoindenter, CD, Polycarbonate
Citation
A. Kuzmenko, A. Kuzko, D. Timakov, M. Dobromyslov, J. Nano- Electron. Phys. 5 No 4, 45 (2013)