Atomic Force Analysis of Elastic Deformations of CD

dc.contributor.authorKuzmenko, A.
dc.contributor.authorKuzko, A.
dc.contributor.authorTimakov, D.
dc.contributor.authorDobromyslov, M.
dc.date.accessioned2014-01-18T09:49:10Z
dc.date.available2014-01-18T09:49:10Z
dc.date.issued2013
dc.description.abstractThe procedure for the determination of elastic parameters according to reference nanometer lithographic marks by atomic force microscopy on samples with up to microscopic sizes is proposed. Analysis of dynamic changes of elastic characteristics that makes it possible to establish the critical rotation velocity of a CD without plastic deformations has been made. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33672ru_RU
dc.identifier.citationA. Kuzmenko, A. Kuzko, D. Timakov, M. Dobromyslov, J. Nano- Electron. Phys. 5 No 4, 45 (2013)ru_RU
dc.identifier.urihttp://essuir.sumdu.edu.ua/handle/123456789/33672
dc.language.isoenru_RU
dc.publisherСумський державний університетru_RU
dc.rights.uricneen_US
dc.subjectElastic effectsru_RU
dc.subjectAtomic force microscopyru_RU
dc.subjectNanoindenterru_RU
dc.subjectCDru_RU
dc.subjectPolycarbonateru_RU
dc.titleAtomic Force Analysis of Elastic Deformations of CDru_RU
dc.typeArticleru_RU

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