Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/43156
Or use following links to share this resource in social networks: Recommend this item
Title Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis
Authors Dobrozhan, Oleksandr Anatoliiovych  
Opanasiuk, Anatolii Serhiiovych  
Kolesnyk, Maksym Mykolaiovych  
Demydenko, Maksym Hennadiiovych
Cheong, Hyeonsik
ORCID http://orcid.org/0000-0001-9238-7596
http://orcid.org/0000-0002-1888-3935
http://orcid.org/0000-0003-2019-8387
Keywords ZnO
ZnO
ZnO
тонкі плівки
тонкие пленки
thin films
структура
структура
structure
імпульсний спрей піроліз
импульсный спрей пиролиз
pulsed spray pyrolysis
FTIR spectroscopy
Raman spectroscopy
Type Article
Date of Issue 2015
URI http://essuir.sumdu.edu.ua/handle/123456789/43156
Publisher WILEY-VCH
License
Citation Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis [Текст] / O. Dobrozhan, A. Opanasyuk, M. Kolesnyk et al. // Phys. Status Solidi. - 2015. - No. 12. - P. 2915–2921.
Abstract Nanocrystalline ZnO films were deposited on to glass substrates in the temperature range of 473–673Kusing pulsed spray pyrolysis. The structural, substructural, and optical properties of the films were investigated bymeans of X-ray diffraction analysis, Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. The effect of the substrate temperature (Ts) on the coherent scattering domain (CSD) sizes L, microstrains e, andmicrostress s grades, and the average density of dislocations r in the films were estimated through the broadening of X-ray lines using the Cauchy and Gauss approximations and the threefold function convolution method. The ZnO films grown at Ts¼623–673K possessed the highest values of L, and the lowest of e, s, and r, indicating high-crystalline quality. The Raman spectra showed peaks located at 95–98, 333–336, 415, 439–442, 572, and 578– 584 cm 1, which were interpreted as E2 low(Zn), (E2 high E2 low), E1(TO), E2 high(O), A1(LO) and E1(LO) phonon modes of the ZnO wurtzite phase. The FTIR spectra showed relatively weak signals at 856, 1405, and 1560 cm 1, corresponding to the C–H and C–O stretching modes, in addition to the main Zn–O mode at 475cm 1, indicating a low content of precursor residues.
Appears in Collections: Наукові видання (ЕлІТ)

Views

Algeria Algeria
1
Bulgaria Bulgaria
1
Canada Canada
1
China China
1145220649
Czechia Czechia
2
France France
2
Germany Germany
13679905
Greece Greece
139097
India India
3
Ireland Ireland
3247300
Japan Japan
1
Lithuania Lithuania
1
Moldova Moldova
1
Netherlands Netherlands
11992
Singapore Singapore
1
Sweden Sweden
1
Switzerland Switzerland
1
Thailand Thailand
1
Ukraine Ukraine
141001004
United Kingdom United Kingdom
61890595
United States United States
-274170647
Unknown Country Unknown Country
141001003
Vietnam Vietnam
139100

Downloads

Algeria Algeria
-1780501314
Australia Australia
1
Brazil Brazil
13679908
Canada Canada
71940
Chile Chile
1
China China
-1780501318
EU EU
1
France France
27355029
Germany Germany
1145220644
India India
27355037
Indonesia Indonesia
1
Ireland Ireland
27355029
Japan Japan
-1780501316
Lithuania Lithuania
1520513
Nigeria Nigeria
1
Romania Romania
61890591
Saudi Arabia Saudi Arabia
1
Singapore Singapore
-1780501311
Spain Spain
1
Switzerland Switzerland
1
Taiwan Taiwan
1520523
Tunisia Tunisia
1
Turkey Turkey
1
Ukraine Ukraine
423000606
United Arab Emirates United Arab Emirates
1
United Kingdom United Kingdom
1
United States United States
-1780501309
Unknown Country Unknown Country
105
Vietnam Vietnam
1

Files

File Size Format Downloads
Dobrozhan_films_ZnO.pdf 451.5 kB Adobe PDF 1416397962

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.