Showing results 1 to 2 of 2
| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2019 | BSIM3v3 Characterization and Simulation of MOS Si1 – xGex Transistors with 130 nm Submicron Technology | Hebali, M.; Bennaoum, M.; Benzohra, M.; Chalabi, D.; Saïdane, A. | Article | 168731423 | 2737610 |
| 2019 | Extraction of Diode’s Electrical Parameters under Forward and Room Temperature Conditions in an InAsSb Based Device | Mahi, K.; Messani, B.; Aït-Kaci, H. | Article | 226089 | 240674 |