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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2014 | Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy | Нам, Д.; Nam, Dahyun; Opanasiuk, Anatolii Serhiiovych; Koval, Pavlo Viktorovych; Коваль, Павел Викторович; Koval, Pavlo Victorovich; Ponomarov, Oleksandr Heorhiiovych; Джонг, А.Р.; Jeong, Ah Reum; Кім, Д.Й.; Ким, Д.Й.; Kim, Gee Yeong; Джо, В.; Jo, William; Чеонг, Г.; Cheong, Hyeonsik | Article | 1070289880 | -2111458637 |