Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/37033
Title: Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Authors: Нам, Д.
Nam, Dahyun
Opanasiuk, Anatolii Serhiiovych 
Koval, Pavlo Viktorovych
Коваль, Павел Викторович
Koval, Pavlo Victorovich
Ponomarov, Oleksandr Heorhiiovych
Джонг, А.Р.
Jeong, Ah Reum
Кім, Д.Й.
Ким, Д.Й.
Kim, Gee Yeong
Джо, В.
Jo, William
Чеонг, Г.
Cheong, Hyeonsik
Keywords: Copper–zinc–tin selenide
Thin films
X-ray diffraction
Energy dispersive X-ray spectroscopy
Raman spectroscopy
Confocal microscopy
Particle induced X-ray emission
Photoluminescence
Issue Year: 2014
Publisher: ELSEVIER
Citation: Dahyun Nama et al. Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy / Dahyun Nama, A.S. Opanasyukb, P.V. Kovalb, A.G. Ponomarevb, Ah Reum Jeongc, Gee Yeong Kimc, William Joc, Hyeonsik Cheong //Thin Solid Films, Volume 562, 1 July 2014, P. 109–113.
Abstract: Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37033
URI: http://essuir.sumdu.edu.ua/handle/123456789/37033
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

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