Browsing by Keywords High resolution X-ray diffraction


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2013 Study of Structure and Intrinsic Stresses of Ge Thin Films on GaAs Kholevchuk, V.V.; Kladko, V.P.; Kuchuk, A.V.; Lytvyn, P.M.; Matveeva, L.A.; Mitin, V.F. Conference Papers 1881992616 -1885595200