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Issue Year Title Author(s) Type Views Downloads
2007 Determination of the parameters for localized states in spatially inhomogeneous semiconductor materials Kolesnyk, Maksym Mykolaiovych; Kosiak, Volodymyr Volodymyrovych; Opanasiuk, Anatolii Serhiiovych; Tyrkusova, Nadiia Volodymyrivna Article 534542992 331675952
2013 Raman and Photoluminescence Investigation of Films of Solid Solutions Zn1-xMnxTe Kurbatov, Denys Ihorovych; Klymov, Oleksii Volodymyrovych; Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Nam, D.; Cheong, H. Conference Papers 87270137 111085656
2011 Точкові дефекти у твердому розчині Cd1-xZnxTe Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Конєва, О.О. Conference Papers 29421592 35648225
2007 Calculation of Fermi level location and point defect ensemble in CdTe single crystal and thin films Kosiak, Volodymyr Volodymyrovych; Opanasiuk, Anatolii Serhiiovych Article 788407684 -60715453
2005 Ансамбль точкових дефектів у плівках CdTe одержаних при регульованому тиску кадмію Kosiak, Volodymyr Volodymyrovych; Opanasiuk, Anatolii Serhiiovych Conference Papers 438458 586891
2011 Ternary semiconductor thin films for solar cells application Kosiak, Volodymyr Volodymyrovych; Opanasiuk, Anatolii Serhiiovych; Hnatenko, Yurii Pavlovych; Koval, Pavlo Viktorovych; Коваль, Павел Викторович Conference Papers 1562478405 1158038731
2007 Нейтральні та іонізовані дефекти в монокристалах та плівках СdТе Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych Conference Papers 3666695 1962930
2016 Influence of zinc concentration on structural and optical properties of polycrystalline CZT thick films obtained by the close spaced sublimation Znamenshchykov, Yaroslav Volodymyrovych; Kosiak, Volodymyr Volodymyrovych; Opanasiuk, Anatolii Serhiiovych Conference Papers 798908494 425901066
2008 Point defect structure in CdTe and ZnTe thin films Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Kolesnyk, Maksym Mykolaiovych Article 179082524 530257783
2013 Аналіз плівок CZTSe методами XRD та µ-PIXE Koval, Pavlo Viktorovych; Коваль, Павел Викторович; Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Ponomarov, Oleksandr Heorhiiovych; Магілін, Д.В.; Чеонг, Х. Conference Papers 27714466 20518841

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