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Title Gate leakage current reduction with advancement of graded barrier AlGaN/GaN HEMT
Authors Das, Palash
Biswas, Dhrubes
Keywords GaN
AlGaN
HEMT
2DEG
Critical thickness
Graded barrier
Gate Leakage current
Type Article
Date of Issue 2011
URI http://essuir.sumdu.edu.ua/handle/123456789/27896
Publisher Видавництво СумДУ
License
Citation Palash Das, Dhrubes Biswas, J. Nano- Electron. Phys. 3 No1, 972 (2011)
Abstract The gate leakage current reduction solution of AlGaN/GaN HEMT device issue has been addressed in this paper with compositional grading of AlGaN barrier layer. This work is also conjugated with the critical thickness limitation of heterostructure material growth. Hence, critical thickness calculation of AlGaN over GaN has been kept in special view. 1D Schrodinger and Poisson solver was used to calculate the 2DEG concentration and effective location to use it in the ATLAS device simulator for the predictions. The proposed Al0.50Ga0.50N/Al0.35Ga0.65N /Al0.20Ga0.80N/GaN HEMT structure exhibits the leakage current of the order of around 15 nA/mm at gate voltage of 1 V. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27896
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

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