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Title New evolving directions for device performance optimization based integration of compound semiconductor devices on silicon
Authors Mukhopadhyay, Partha
Das, Palash
Chang, Edward Y.
Biswas, Dhrubes
Keywords metamorphic buffer
compound semiconductor
integration
III-V/Si
strain
dislocation density
lattice mismatch
Type Article
Date of Issue 2011
URI http://essuir.sumdu.edu.ua/handle/123456789/27935
Publisher Видавництво СумДУ
License
Citation Partha Mukhopadhyay, Palash Das, Edward Y. Chang, Dhrubes Biswas, J. Nano- Electron. Phys. 3 No1, 1102 (2011)
Abstract Rapid advances in Compound Semiconductor (CS) technologies over last several decades have lead to high performances in peak power, power added efficiency (PAE) and linearity, but these devices are not amenable for integration on mainstream silicon technologies. A strategic direction has been presented for the growth of CS devices on silicon with challenges abounding in scalability, compatibility and cost effectiveness while extracting optimized device performances. The approach at IIT Kharagpur has been simulation and experimental development of customized metamorphic buffers that are scalable and compatible to silicon without sacrificing any CS performances, primarily for electronic applications. This has evolved into a new strategic paradigm for performance optimization of seemingly competing and disparate properties which otherwise will not be supported by conventional process technologies. Simulation of these next generation structures reveals assimilation of superior device properties, with a novel five Indium content composite channel MHEMT indicating improvements over existing composite channel MHEMT in terms of linearity and higher current performances. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27935
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

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