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Title Structural and optical-properties of CdTe and CdMnTe films
Authors Opanasiuk, Anatolii Serhiiovych  
Koval, Pavlo Viktorovych
Коваль, Павел Викторович
Kosiak, Volodymyr Volodymyrovych
Fochuk, P.M.
Bolotnikov, A.E.
James, R.B.
Keywords CdTe
Cd1-xMnxTe
structural analyses
scattering domains
wide band-gap semiconductors
transmission- and reflection-spectra
Type Conference Papers
Date of Issue 2012
URI http://essuir.sumdu.edu.ua/handle/123456789/30130
Publisher Brookhaven National Laboratory
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Citation Structural and optical-properties of CdTe and CdMnTe films / A.S. Opanasyuk, P.V. Koval, V.V. Kosyak [et al.] [Текст] // Мaтеріaли міжнaродної конференції 2012-SPIE Optics & Photonics Conference. – San-Diego, USA, 2012.
Abstract We undertook a detailed investigation of the structural- and optical-properties of CdTe- and Cd1-xMnxTe-semiconductor films deposited by close-spaced vacuum sublimation using thermal evaporation on non-oriented substrates. From our structural- and phase-analysis of the layers, we obtained information on their structure, deformations, grain size, and content of dislocations for films deposited at different substrate temperatures. We considered that despite the presence of defects in the crystals, the films offer promise for fabrication into x-ray detectors. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30130
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