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Title Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
Authors Kurbatov, Denys Ihorovych  
Opanasiuk, Anatolii Serhiiovych  
Денисенко, В.
Денисенко, В.
Denisenko, V.
Крамченков, А.
Крамченков, А.
Kramchenkov, А.
Захарець, M.
Захарец, M.
Zaharets, M.
Keywords zinc sulfide
thin films
surface morphology
roughness
Rutherford backscattering spectroscopy
chemical composition
Type Article
Date of Issue 2008
URI http://essuir.sumdu.edu.ua/handle/123456789/30133
Publisher V. Lashkaryov Institute of Semiconductor Physics
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Citation Kurbatov D. Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure [Текст] / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics, Quantum Electronics & Optoelectronics. – 2008. – V. 11 (3). – P. 252-256.
Abstract The surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film system obtained by close-spaced vacuum sublimation technique under different grow conditions were investigated. Examination of surface profile and morphology was performed by scanning electron and optical microscopy. Chemical composition was studied by Rutherford back scattering method. Results of morphology studies enabled to determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS layers on the growth conditions. The researches of chemical composition allowed to determine the concentration of compound elements and impurities, deviation from stoichiometry and thickness distribution of chemical elements. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30133
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China China
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