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Title Study of Electrical, Optical and Structural Properties of Al- Doped ZnO Thin Films on PEN Substrates
Authors Agarwal, Mohit
Modi, Pankaj
Dusane, R.O.
ORCID
Keywords Al doped ZnO
RF magnetron sputtering
Type Article
Date of Issue 2013
URI http://essuir.sumdu.edu.ua/handle/123456789/31021
Publisher Сумський державний університет
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Citation Mohit Agarwal, Pankaj Modi, R.O. Dusane, J. Nano- Electron. Phys. 5 No 2, 02027 (2013)
Abstract Aluminum-doped zinc oxide (AZO), as one of the most promising transparent conducting oxide (TCO) material, has now been widely used in thin film solar cells. Most of the study of AZO films till date has been done on glass substrates but nowadays there is a growing interest in replacing glass with polymer substrate for the thin-film solar cell technology and many other flexible optoelectronic devices. In this study, AZO thin films were deposited at room temperature by RF magnetron sputtering on flexible substrates from a 3 inch diameter target of 2 wt % Al2O3 in zinc oxide. The effect of RF power on the structural, optical and electrical properties of AZO films was investigated by X-ray Diffraction (XRD), Hall measurement, and UV-visible spectrophotometery. The XRD data indicates a preferential c-axis orientation for all the films. All films exhibit high transmittance ( 85%) in visible region. Films deposited at 60 W power exhibit lowest resistivity of 1.2  10 – 3 Ωcm. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/31021
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

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Austria Austria
1
Canada Canada
1
China China
29443
Denmark Denmark
1
Germany Germany
2
India India
6001595
Iran Iran
5
Japan Japan
480693882
Lithuania Lithuania
1
Russia Russia
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1886571715
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