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Title Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
Authors Kiselev, D.A.
Ksenich, S.V.
Zhukov, R.N.
Bykov, A.S.
Malinkovich, M.D.
Shvartsman, V.V.
Lupascu, D.C.
Parkhomenko, Yu.N.
ORCID
Keywords LiNbO3 thin film
Piezoresponse force microscopy
Domain structure
Type Article
Date of Issue 2013
URI http://essuir.sumdu.edu.ua/handle/123456789/33668
Publisher Сумський державний університет
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Citation D.A. Kiselev, S.V. Ksenich, R.N. Zhukov, A.S. Bykov, M.D. Malinkovich, V.V. Shvartsman, D.C. Lupascu, Yu.N. Parkhomenko, J. Nano- Electron. Phys. 5 No 4, 04041 (2013)
Abstract Electro-optic LiNbO3 thin films were deposited on Si(100) and Si(111) substrates using a radio-frequency magnetron sputtering process. The piezoelectric properties of the LiNbO3 films were investigated using the scanning probe microscopy in the piezoresponse mode. The obtained results show the high degree of grains orientation in polycrystalline structure. The piezoelectric modulus (dzz) was estimated to be 16 pm/V (for LiNbO3 / Si(100)) and 22 pm/V (for LiNbO3 / Si(111)) and the polarization about of 0.37 C·m – 2. These values are larger than those reported previously for LiNbO3 films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33668
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

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China China
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France France
1
Germany Germany
2
Italy Italy
244451959
Japan Japan
1
Lithuania Lithuania
1
Russia Russia
6
Singapore Singapore
1
Ukraine Ukraine
21676021
United Kingdom United Kingdom
1
United States United States
244451957
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Vietnam Vietnam
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