Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/33848
Title: Raman analysis of Zn1-xMnxTe polycrystalline films
Authors: Klymov, Oleksii Volodymyrovych
Kurbatov, Denys Ihorovych 
Opanasiuk, Anatolii Serhiiovych 
Kosiak, Volodymyr Volodymyrovych
Копач, В.
Kopach, V.
Болотников, А.Е.
Bolotnikov, А.Е.
Джеймс, Р.Б.
James, R.B.
Фочук, П.М.
Fochuk, P.M.
Keywords: Raman spectroscopy
surface morphology
x-ray diffraction
lattice parameters
solid solution of Zn1-xMnxTe
closed space vacuum sublimation
Issue Year: 2013
Publisher: SPIE
Citation: Raman analysis of Zn1-xMnxTe polycrystalline films [Text] / О. V. Klimov , D. I. Kurbatov , A. S. Opanasyuk , V. V. Kosyak , V. Kopach , P. M. Fochuk , A. E. Bolotnikov, R. B. James // Proc. of SPIE. – 2013. – P. 88521G-1-88521G-5.
Series/Report no.: Vol. 8852;
Abstract: In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848
URI: http://essuir.sumdu.edu.ua/handle/123456789/33848
Type: Article
Appears in Collections:Наукові видання (ЕлІТ)

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