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Title Substructural Features of Zn1-xMnxTe Solid Solution Thin Films
Authors Kurbatov, Denys Ihorovych  
Klymov, Oleksii Volodymyrovych
Opanasiuk, Anatolii Serhiiovych  
Danilchenko, S.M.
Khlyap, H.M.
ORCID http://orcid.org/0000-0002-2754-6367
http://orcid.org/0000-0002-1888-3935
Keywords Substructure
X-ray diffraction patterns
Microdeformations
Orientation factor
Type Conference Papers
Date of Issue 2012
URI http://essuir.sumdu.edu.ua/handle/123456789/35057
Publisher Sumy State University
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Citation Substructural Features of Zn1-xMnxTe Solid Solution Thin Films / O. V. Klymov, D. I. Kurbatov, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V. 1, No3. - 03TF23
Abstract The substructural characteristics of Zn1-xMnxTe films deposited by closed space vacuum sublimation method under various condensation conditions are investigated. Sizes of the coherent scattering domain size, microdeformation degree, staking fault defects’ concentration in the condensates, the averaged dislocation density at the subgrain boundaries and in their bulk as well as the total dislocation concentration are determined by the physical broadening of the X-ray lines using the Cauchy and gauss approximations and the threefold function convolution method. The calculations are compared with data for undoped ZnTe. It is found out that the Mn-doping causes some degradation of structural characteristics of the condensates compared with undoped layers. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35057
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China China
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4040298
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