Please use this identifier to cite or link to this item:
http://essuir.sumdu.edu.ua/handle/123456789/35100| Title: | Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique |
| Authors: | Opanasiuk, Anatolii Serhiiovych  Ivashchenko, Maksym Mykolaiovych Klymov, Oleksii Volodymyrovych Kurbatov, Denys Ihorovych Kolesnyk, Maksym Mykolaiovych Cheong, H. Nam, D. |
| Keywords: | Zinc sulfide Zinc selenide Zinc telluride Films Replica Phonon Raman spectroscopy |
| Issue Year: | 2012 |
| Publisher: | Sumy State University |
| Citation: | Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF21 |
| Abstract: | In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35100 |
| URI: | http://essuir.sumdu.edu.ua/handle/123456789/35100 |
| Type: | Theses |
| Appears in Collections: | Наукові видання (ЕлІТ) |
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