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Title | Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique |
Authors |
Opanasiuk, Anatolii Serhiiovych
![]() Ivashchenko, Maksym Mykolaiovych ![]() Klymov, Oleksii Volodymyrovych Kurbatov, Denys Ihorovych ![]() Kolesnyk, Maksym Mykolaiovych Cheong, H. Nam, D. |
Keywords |
Zinc sulfide Zinc selenide Zinc telluride Films Replica Phonon Raman spectroscopy |
Type | Conference Papers |
Date of Issue | 2012 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/35100 |
Publisher | Sumy State University |
License | |
Citation | Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF21 |
Abstract |
In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors
deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed
longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the
phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films.
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