Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/35100

Or use following links to share this resource in social networks: Recommend this item

Title	Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique
Authors	Opanasiuk, Anatolii Serhiiovych Ivashchenko, Maksym Mykolaiovych Klymov, Oleksii Volodymyrovych Kurbatov, Denys Ihorovych Kolesnyk, Maksym Mykolaiovych Cheong, H. Nam, D.
Keywords	Zinc sulfide Zinc selenide Zinc telluride Films Replica Phonon Raman spectroscopy
Type	Conference Papers
Date of Issue	2012
URI	http://essuir.sumdu.edu.ua/handle/123456789/35100
Publisher	Sumy State University
License
Citation	Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF21
Abstract	In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35100
Appears in Collections:	Наукові видання (ЕлІТ)