Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/35100
Title: Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique
Authors: Opanasiuk, Anatolii Serhiiovych 
Ivashchenko, Maksym Mykolaiovych
Klymov, Oleksii Volodymyrovych
Kurbatov, Denys Ihorovych 
Kolesnyk, Maksym Mykolaiovych
Cheong, H.
Nam, D.
Keywords: Zinc sulfide
Zinc selenide
Zinc telluride
Films
Replica
Phonon
Raman spectroscopy
Issue Year: 2012
Publisher: Sumy State University
Citation: Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF21
Abstract: In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35100
URI: http://essuir.sumdu.edu.ua/handle/123456789/35100
Type: Theses
Appears in Collections:Наукові видання (ЕлІТ)

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