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Title | Retention Behaviour of MNOS Memory Devices with Embedded Si or Ge Nanocrystals – Computer Simulation |
Authors |
Molnár, K.Z.
Turmezei, P. Horváth, Zs.J. Kovács, B. |
ORCID | |
Keywords |
Non-volatile memory MNOS Tunneling Retention |
Type | Conference Papers |
Date of Issue | 2013 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/35385 |
Publisher | Sumy State University |
License | |
Citation | Retention Behaviour of MNOS Memory Devices with Embedded Si or Ge Nanocrystals – Computer Simulation [Текст] / K.Z. Molna'r, P. Turmezei, Z.J. Horva'th et al. // Nanomaterials: Applications & Properties (NAP-2013) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2013. - V.2, No4. - 04NAESP14 |
Abstract |
The charge retention behaviour of MNOS structures with embedded Si or Ge nanocrystals are studied by computer simulation. It is obtained that the oxide thickness and the location of nanocrystlas affect the retention behaviour very strongly. The retention time changes from a few ms to several years.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35385 |
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