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Title | On the Applicability of HF and μ-PCD Methods for Determination of Carrier Recombination Lifetime in the Non-passivated Single-crystal Silicon Samples |
Authors |
Anfimov, I.M.
Kobeleva, S.P. Schemerov, I.V. Orlova, M.N. |
ORCID | |
Keywords |
Single-crystal silicon Contactless μ-PCD method Carrier recombination lifetime Photocon-ductivity decay |
Type | Article |
Date of Issue | 2014 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/36130 |
Publisher | Sumy State University |
License | |
Citation | I.М. Anfimov, S.P. Kobeleva, I.V. Schemerov, M.N. Orlova, J. Nano- Electron. Phys. 6 No 3, 03018 (2014) |
Abstract |
Comparison of the results of measuring the carrier recombination lifetime in silicon single crystals by contactless HF and microwave μ-PCD methods was carried out. It has been shown that HF method gives a large error compared with a μ-PCD method.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/36130 |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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File | Size | Format | Downloads |
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On the Applicability of HF and -PCD Methods.pdf | 273,24 kB | Adobe PDF | 67404188 |
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