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Title Raman investigation on thin and thick CdTe films obtained by close spaced vacuum sublimation technique
Authors Нам, Д.
Нам, Д.
Nam, Dahyun
Чеонг, Г.
Чеонг, Г.
Cheong, H.
Opanasiuk, Anatolii Serhiiovych  
Koval, Pavlo Viktorovych
Коваль, Павел Викторович
Kosiak, Volodymyr Volodymyrovych
Фочук, Петро Михайлович
Фочук, Петр Михайлович
Fochuk, Petro Mikhailovich
Keywords thick films
thin films
CdTe
structure
Raman spectroscopy
Type Article
Date of Issue 2014
URI http://essuir.sumdu.edu.ua/handle/123456789/37061
Publisher WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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Citation Raman investigation on thin and thick CdTe films obtained by close spaced vacuum sublimation technique / D. Nam, H. Cheong, A. S. Opanasyuk, P. V. Koval, V. V. Kosyak, and P. M. Fochuk // «Phys. Status Solidi C» 2014, V.11, №9, Р. 1515-1518
Abstract The CdTe thin and thick films were obtained by the close spaced vacuum sublimation technique on a glass substrate under the following growth conditions: the evaporator temperature was 620 °C; and the substrate temperature was varied in the range from 250 °C to 550 °C. High purity CdTe powder was used as a charge for evaporation. The Raman spectra were measured using TRIAX 320 and TRIAX 550 spectrometers at room temperature. The 488-nm line and 514.5-nm line of an Ar+ laser and a 785-nm diode laser were used as excitation sources. The signal was collected by the liquid nitrogen cooled chargecoupled-device (CCD) detector. A number of intense Raman peaks at 140, 167, 190, 271, 332 and 493 cm-1 were observed and were interpreted as TO (140 cm-1), 1LO (167 cm-1), 2LO (332 cm-1), 3LO (493 cm-1) phonon modes and plasmon-phonon mode (190 cm-1). The presence of several phonon replicas in the Raman spectra confirms high crystal quality of the samples. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37061
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