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Title | Simulation of Radiation Effects in SiO2/Si Structures |
Authors |
Komarov, A.F.
Zayats, G.M. Komarov, F.F. Miskiewicz, S.A. Michailov, V.V. |
ORCID | |
Keywords |
Integrated сircuits Radiation MIS Numerical іimulation |
Type | Article |
Date of Issue | 2014 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/37281 |
Publisher | Sumy State University |
License | |
Citation | Proc. NAP 3, 01PISERE04 (2014) |
Abstract |
We describe space-time evolution of electric charge induced in dielectric layer of simulated metal-insulator-semiconductor structures due to irradiation with X-rays. The system of equations used as a basis of the simulation model is solved iteratively by efficient numerical method. The obtained simulation results correlate well with the respective data presented in other scientific publications. |
Appears in Collections: |
Наукові видання (ЕлІТ) |
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File | Size | Format | Downloads |
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Komarov_Zayats_Komarov_Miskiewicz_Michailov.pdf | 555,04 kB | Adobe PDF | 477686331 |
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